SN74BCT8240ANT

Mfr. #:: SN74BCT8240ANT
説明:: IC SCAN TEST DEVICE BUFF 24-DIP
ライフサイクル:: メーカー新製品
データシート:: SN74BCT8240ANT データシート
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詳しくは:: SN74BCT8240ANT 詳しくは SN74BCT8240ANT Product Details

製品属性
属性値

Tags: SN74BCT8240, SN74BCT82, SN74BCT8, SN74B, SN74, SN7

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Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
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Step1:
Vacuum Packaging with PL

Step2:
Anti-Static Bag

Step3:
Packaging Boxes

SN74BCT8240ANT 説明

***i-Key: IC SCAN TEST DEVICE BUFF 24-DIP

***ark: Specialty Logic IC; Logic Family:BCT; Supply Voltage Min:4.5V; Supply Voltage Max:5.5V; Package/Case:24-PDIP; No. of Pins:24; Operating Temperature Range:0°C to +70°C; Input Type:TTL; Leaded Process Compatible:Yes; Output Type:TTL ;RoHS Compliant: Yes

***as Instruments: The 'BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F240 and 'BCT240 octal buffers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal buffers. In the test mode, the normal operation of the SCOPETM octal buffers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations, as described in IEEE Standard 1149.1-1990. Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54BCT8240A is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74BCT8240A is characterized for operation from 0°C to 70°C.

Market price

モデル	説明	ストック	価格
SN74BCT8240ANT DISTI # SN74BCT8240ANT-ND	IC SCAN TEST DEVICE BUFF 24-DIP RoHS: Compliant Min Qty: 60 Container: Tube	Limited Supply - Call
SN74BCT8240ANTG4 DISTI # SN74BCT8240ANTG4-ND	IC SCAN TEST DEVICE BUFF 24-DIP RoHS: Compliant Min Qty: 60 Container: Tube	Limited Supply - Call
SN74BCT8240ANT DISTI # 595-SN74BCT8240ANT	Buffers & Line Drivers Device w/Octal Inverting Buffers RoHS: Compliant	0
SN74BCT8240ANTE4 DISTI # 595-SN74BCT8240ANTE4	Specialty Function Logic Device w/Octal Inverting Buffers RoHS: Compliant	0
SN74BCT8240ANT	Boundary Scan Bus Driver, BCT/FBT Series, 2-Func, 4-Bit, Inverted Output, BICMOS, PDIP24 RoHS: Compliant	1404	1000:$6.7600 500:$7.1200 100:$7.4100 25:$7.7300 1:$8.3200

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