SN74BCT8240ADWR

SN74BCT8240ADWR
Mfr. #:
SN74BCT8240ADWR
説明:
Buffers & Line Drivers Device w/Octal Inverting Buffers
ライフサイクル:
メーカー新製品
データシート:
SN74BCT8240ADWR データシート
配達:
DHL FedEx Ups TNT EMS
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ECAD Model:
詳しくは:
SN74BCT8240ADWR 詳しくは SN74BCT8240ADWR Product Details
製品属性
属性値
メーカー:
テキサスインスツルメンツ
製品カテゴリ:
バッファとラインドライバ
JBoss:
Y
入力行数:
8 Input
出力ラインの数:
8 Output
極性:
反転
供給電圧-最大:
5.5 V
供給電圧-最小:
4.5 V
最低動作温度:
0 C
最高作動温度:
+ 70 C
取り付けスタイル:
SMD / SMT
パッケージ/ケース:
SOIC-24 Wide
包装:
リール
関数:
スキャンバッファ/ラインドライバ
高さ:
2.35 mm
長さ:
15.4 mm
出力タイプ:
3-State
静止電流:
35 mA
テクノロジー:
BiCMOS
幅:
7.52 mm
ブランド:
テキサスインスツルメンツ
ロジックファミリ:
BCT
ロジックタイプ:
バウンダリスキャン(JTAG)ロジック
チャネル数:
8
供給電流-最大:
52000 uA
高レベル出力電流:
- 15 mA
入力信号タイプ:
シングルエンド
低レベル出力電流:
64 mA
動作供給電圧:
4.5 V to 5.5 V
製品タイプ:
バッファとラインドライバ
伝播遅延時間:
7.5 ns at 5 V
ファクトリーパックの数量:
1
サブカテゴリ:
ロジックIC
単位重量:
0.038731 oz
Tags
SN74BCT8240ADWR, SN74BCT8240AD, SN74BCT8240, SN74BCT82, SN74BCT8, SN74B, SN74, SN7
Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
Our experienced sales team and tech support team back our services to satisfy all our customers.

we buy and manage excess electronic components, including excess inventory identified for disposal.
Email us if you have excess stock to sell.

Email: [email protected]

Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
***i-Key
IC SCAN TEST DEVICE BUFF 24-SOIC
***as Instruments
The 'BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F240 and 'BCT240 octal buffers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal buffers. In the test mode, the normal operation of the SCOPETM octal buffers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations, as described in IEEE Standard 1149.1-1990. Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54BCT8240A is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74BCT8240A is characterized for operation from 0°C to 70°C.
モデル 説明 ストック 価格
SN74BCT8240ADWR
DISTI # SN74BCT8240ADWR-ND
IC SCAN TEST DEVICE BUFF 24-SOIC
RoHS: Compliant
Min Qty: 2000
Container: Tape & Reel (TR)
Limited Supply - Call
    SN74BCT8240ADWRE4
    DISTI # SN74BCT8240ADWRE4-ND
    IC SCAN TEST DEVICE BUFF 24-SOIC
    RoHS: Compliant
    Min Qty: 2000
    Container: Tape & Reel (TR)
    Limited Supply - Call
      SN74BCT8240ADWRG4
      DISTI # SN74BCT8240ADWRG4-ND
      IC SCAN TEST DEVICE 24SOIC
      RoHS: Compliant
      Min Qty: 2000
      Container: Tape & Reel (TR)
      Limited Supply - Call
        SN74BCT8240ADWR
        DISTI # 595-SN74BCT8240ADWR
        Buffers & Line Drivers Device w/Octal Inverting Buffers
        RoHS: Compliant
        0
          SN74BCT8240ADWRE4
          DISTI # 595-SN74BCT8240ADWRE
          Specialty Function Logic Prog PCM w/Microphn Amps & Speaker Drvr
          RoHS: Compliant
          0
            SN74BCT8240ADWRG4
            DISTI # 595-74BCT8240ADWRG4
            Specialty Function Logic IEEE Std 1149.1 Bndry Sacn Tst Devic
            RoHS: Compliant
            0
              SN74BCT8240ADWRBoundary Scan Bus Driver, BCT/FBT Series, 2-Func, 4-Bit, Inverted Output, BICMOS, PDSO24
              RoHS: Compliant
              30000
              • 1000:$6.7600
              • 500:$7.1200
              • 100:$7.4100
              • 25:$7.7300
              • 1:$8.3200
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              SN74BCT8245ADW

              Mfr.#: SN74BCT8245ADW

              OMO.#: OMO-SN74BCT8245ADW-TEXAS-INSTRUMENTS

              Specialty Function Logic IEEE 1149.1
              可用性
              ストック:
              Available
              注文中:
              5500
              数量を入力してください:
              SN74BCT8240ADWRの現在の価格は参考用です。最高の価格をご希望の場合は、お問い合わせまたは直接メールで営業チーム[email protected]までご連絡ください。
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