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SN74ABT18640DLRG4

SN74ABT18640DLRG4
Mfr. #:
SN74ABT18640DLRG4
説明:
Specialty Function Logic Device w/18-Bit Inv Bus Transceiver
ライフサイクル:
メーカー新製品
データシート:
SN74ABT18640DLRG4 データシート
配達:
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ECAD Model:
詳しくは:
SN74ABT18640DLRG4 詳しくは SN74ABT18640DLRG4 Product Details
製品属性
属性値
メーカー：
テキサスインスツルメンツ
製品カテゴリ：
特殊機能ロジック
JBoss：
Y
製品：
境界スキャンJTAGロジック
シリーズ：
74AB
動作供給電圧：
4.5 V to 5.5 V
パッケージ/ケース：
SSOP-56
包装：
リール
ブランド：
テキサスインスツルメンツ
取り付けスタイル：
SMD / SMT
製品タイプ：
特殊機能ロジック
ファクトリーパックの数量：
1
サブカテゴリ：
ロジックIC
単位重量：
0.024508 oz
Tags
SN74ABT18640DL, SN74ABT18640, SN74ABT1864, SN74ABT186, SN74ABT18, SN74ABT1, SN74AB, SN74A, SN74, SN7
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We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
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Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
***i-Key
IC SCAN TEST DEVICE 18BIT 56SSOP
***as Instruments
The 'ABT18640 scan test devices with 18-bit inverting bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are 18-bit inverting bus transceivers. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM bus transceivers. Data flow is controlled by the direction-control (DIR) and output-enable () inputs. Data transmission is allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. can be used to disable the device so that the buses are effectively isolated. In the test mode, the normal operation of the SCOPETM bus transceivers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990. Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN74ABT18640 is available in TI's shrink small-outline (DL) and thin shrink small-outline (DGG) packages, which provide twice the I/O pin count and functionality of standard small-outline packages in the same printed-circuit-board area. The SN54ABT18640 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABT18640 is characterized for operation from -40°C to 85°C.
モデル 説明 ストック 価格
SN74ABT18640DLRG4
DISTI # SN74ABT18640DLRG4-ND		IC SCAN TEST DEVICE 18BIT 56SSOP
RoHS: Compliant
Min Qty: 1000
Container: Tape & Reel (TR)		Limited Supply - Call
    SN74ABT18640DLRG4
    DISTI # 595-SN74ABT18640DLRG    		Specialty Function Logic Device w/18-Bit Inv Bus Transceiver
    RoHS: Compliant    		0
      画像 モデル 説明
      SN74ABT18640DL

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      可用性
      ストック:
      Available
      注文中:
      4000
      数量を入力してください:
      SN74ABT18640DLRG4の現在の価格は参考用です。最高の価格をご希望の場合は、お問い合わせまたは直接メールで営業チーム[email protected]までご連絡ください。
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