SN74BCT8373ADWRE4

Mfr. #:: SN74BCT8373ADWRE4
説明:: Specialty Function Logic Fixed LDO Volt Reg
ライフサイクル:: メーカー新製品
データシート:: SN74BCT8373ADWRE4 データシート
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詳しくは:: SN74BCT8373ADWRE4 詳しくは SN74BCT8373ADWRE4 Product Details

製品属性
属性値

メーカー：: テキサスインスツルメンツ

製品カテゴリ：: 特殊機能ロジック

JBoss：: Y

パッケージ/ケース：: SOIC-24

包装：: リール

ブランド：: テキサスインスツルメンツ

取り付けスタイル：: SMD / SMT

製品タイプ：: 特殊機能ロジック

ファクトリーパックの数量：: 1

サブカテゴリ：: ロジックIC

単位重量：: 0.022025 oz

Tags: SN74BCT8373ADWR, SN74BCT8373AD, SN74BCT8373A, SN74BCT8373, SN74BCT83, SN74BCT8, SN74B, SN74, SN7

Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
Our experienced sales team and tech support team back our services to satisfy all our customers.

we buy and manage excess electronic components, including excess inventory identified for disposal.
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Step1:
Vacuum Packaging with PL

Step2:
Anti-Static Bag

Step3:
Packaging Boxes

SN74BCT8373ADWRE4 説明

***i-Key: IC SCAN TEST DEVICE LATCH 24SOIC

***ark: Specialty Logic IC; Logic Family:BCT; Supply Voltage Min:4.5V; Supply Voltage Max:5.5V; Package/Case:24-SOIC; No. of Pins:24; Operating Temperature Range:0°C to +70°C; Input Type:TTL; Leaded Process Compatible:Yes; Output Type:TTL ;RoHS Compliant: Yes

***as Instruments: The 'BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPETM testability integrated- circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F373 and 'BCT373 octal D-type latches. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal latches. In the test mode, the normal operation of the SCOPETM octal latches is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary scan test operations, as described in IEEE Standard 1149.1-1990. Four dedicated test terminals are used to control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry can perform other testing functions such as parallel signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54BCT8373A is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74BCT8373A is characterized for operation from 0°C to 70°C.

Market price

モデル	説明	ストック	価格
SN74BCT8373ADWRE4 DISTI # SN74BCT8373ADWRE4-ND	IC SCAN TEST DEVICE LATCH 24SOIC RoHS: Compliant Min Qty: 2000 Container: Tape & Reel (TR)	Limited Supply - Call
SN74BCT8373ADWRE4 DISTI # 595-SN74BCT8373ADWRE	Specialty Function Logic Fixed LDO Volt Reg RoHS: Compliant	0

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