 |  | | |
| PartNumber | 8V182512IDGGREP | 8V18646AIPMREP | 8V18502AIPMREP |
| Description | Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device | Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device | Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device |
| Manufacturer | Texas Instruments | Texas Instruments | Texas Instruments |
| Product Category | Specialty Function Logic | Specialty Function Logic | Specialty Function Logic |
| RoHS | Y | N | N |
| Series | SN74LVTH182512-EP | SN74LVTH18646A-EP | SN74LVTH18502A-EP |
| Operating Supply Voltage | 3.3 V | 3.3 V | 3.3 V |
| Minimum Operating Temperature | - 40 C | - | - |
| Maximum Operating Temperature | + 85 C | - | - |
| Package / Case | TSSOP-64 | LQFP-64 | LQFP-64 |
| Packaging | Reel | Reel | Reel |
| Function | Scan Test Device with Universal Bus Transceiver | Scan Test Device with Bus Transceiver / Register | Scan Test Device with Universal Bus Transceiver |
| Number of Circuits | 2 | 2 | 2 |
| Operating Temperature Range | - 40 C to + 85 C | - | - |
| Brand | Texas Instruments | Texas Instruments | Texas Instruments |
| Mounting Style | SMD/SMT | SMD/SMT | SMD/SMT |
| Product Type | Specialty Function Logic | Specialty Function Logic | Specialty Function Logic |
| Propagation Delay Time | 7.7 ns | 7.1 ns | 7.7 ns |
| Factory Pack Quantity | 2000 | 1000 | 1000 |
| Subcategory | Logic ICs | Logic ICs | Logic ICs |
| Part # Aliases | V62/04730-01XE | V62/04731-01XE | V62/04729-01XE |
| Unit Weight | 0.009263 oz | 0.011803 oz | 0.011803 oz |
| Moisture Sensitive | - | Yes | Yes |
| メーカー | モデル | 説明 | RFQ |
|---|---|---|---|
Texas Instruments |
8V182512IDGGREP | Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device | |
| 8V18646AIPMREP | Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device | ||
| 8V18502AIPMREP | Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device | ||
| 8V18646AIPMREP | Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device | ||
| 8V18502AIPMREP | Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device | ||
| 8V182512IDGGREP | Specialty Function Logic Mil Enhanced 3.3V ABT Scan Test Device |